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Synchrotron measurement of the effect of dielectric porosity and air gaps on the stress in advanced Cu/low-k interconnects

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1891 since deposited on 2021-10-18
1last month
Acq. date: 2026-10-03

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1891 since deposited on 2021-10-18
1last month
Acq. date: 2026-10-03

Citations