Publication:
BJT effect analysis in p- and n-SOI MuGFETs with high-k gate dielectrics and TiN metal gate electrode for a 1T-DRAM application
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1912 since deposited on 2021-10-19
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Acq. date: 2025-12-09
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1912 since deposited on 2021-10-19
2last month
2last week
Acq. date: 2025-12-09
Citations