Publication:
A new method for determining the front and back interface trap densities of accumulation mode SOI MOSFETs at 77K
Date
Loading...
Files
Journal
Abstract
Description
Metrics
Views
2031 since deposited on 2021-09-29
Acq. date: 2026-01-07
Citations
Metrics
Views
2031 since deposited on 2021-09-29
Acq. date: 2026-01-07
Citations