A new method for determining the front and back interface trap densities of accumulation mode SOI MOSFETs at 77K

dc.contributor.author	Martino, Joao Antonio
dc.contributor.author	Simoen, Eddy
dc.contributor.author	Claeys, Cor
dc.contributor.imecauthor	Simoen, Eddy
dc.contributor.orcidimec	Simoen, Eddy::0000-0002-5218-4046
dc.date.accessioned	2021-09-29T13:10:47Z
dc.date.available	2021-09-29T13:10:47Z
dc.date.embargo	9999-12-31
dc.date.issued	1995
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/756
dc.source.beginpage	1799
dc.source.endpage	1803
dc.source.issue	10
dc.source.journal	Solid-State Electronics
dc.source.volume	38
dc.title	A new method for determining the front and back interface trap densities of accumulation mode SOI MOSFETs at 77K
dc.type	Journal article
dspace.entity.type	Publication
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