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The use of convergent beam electron diffraction for stress measurements in shallow trench isolation structures
Publication:
The use of convergent beam electron diffraction for stress measurements in shallow trench isolation structures
Date
2001
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Stuer, Cindy
;
Van Landuyt, J.
;
Bender, Hugo
;
Rooyackers, Rita
;
Badenes, Gonçal
Journal
Materials Science in Semiconductor Processing
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1903
since deposited on 2021-10-14
Acq. date: 2025-10-24
Citations
Metrics
Views
1903
since deposited on 2021-10-14
Acq. date: 2025-10-24
Citations