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Understanding tip-induced nanoscale wear for tomographic atomic force microscopy
Publication:
Understanding tip-induced nanoscale wear for tomographic atomic force microscopy
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Date
2019
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Celano, Umberto
;
Xiaoli, Hu
;
Pandey, Komal
;
Wouters, Lennaert
;
Paredis, Kristof
;
Hantschel, Thomas
;
van der Heide, Paul
;
Martini, Ashlie
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1993
since deposited on 2021-10-27
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Acq. date: 2025-12-15
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Metrics
Views
1993
since deposited on 2021-10-27
1
last month
1
last week
Acq. date: 2025-12-15
Citations