Publication:

Understanding tip-induced nanoscale wear for tomographic atomic force microscopy

Date

2019
Meeting abstract
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dc.contributor.authorCelano, Umberto
dc.contributor.authorXiaoli, Hu
dc.contributor.authorPandey, Komal
dc.contributor.authorWouters, Lennaert
dc.contributor.authorParedis, Kristof
dc.contributor.authorHantschel, Thomas
dc.contributor.authorvan der Heide, Paul
dc.contributor.authorMartini, Ashlie
dc.contributor.imecauthorCelano, Umberto
dc.contributor.imecauthorPandey, Komal
dc.contributor.imecauthorWouters, Lennaert
dc.contributor.imecauthorParedis, Kristof
dc.contributor.imecauthorHantschel, Thomas
dc.contributor.imecauthorvan der Heide, Paul
dc.contributor.orcidimecCelano, Umberto::0000-0002-2856-3847
dc.contributor.orcidimecWouters, Lennaert::0000-0002-6730-9542
dc.contributor.orcidimecParedis, Kristof::0000-0002-5163-4164
dc.contributor.orcidimecHantschel, Thomas::0000-0001-9476-4084
dc.contributor.orcidimecvan der Heide, Paul::0000-0001-6292-0329
dc.date.accessioned2021-10-27T07:54:41Z
dc.date.available2021-10-27T07:54:41Z
dc.date.issued2019
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/32669
dc.identifier.urlhttps://www2.avs.org/symposium2019/Papers/Paper_NS-ThP8.html
dc.source.beginpageNS-ThP8
dc.source.conferenceAVS 66th International Symposium & Exhibition
dc.source.conferencedate20/10/2019
dc.source.conferencelocationColumbus, OH USA
dc.title

Understanding tip-induced nanoscale wear for tomographic atomic force microscopy

dc.typeMeeting abstract
dspace.entity.typePublication
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