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Assessment of the impact of inelastic tunneling on the frequency-depth conversion from low-frequency noise spectra
Publication:
Assessment of the impact of inelastic tunneling on the frequency-depth conversion from low-frequency noise spectra
Date
2014
Journal article
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27740.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Simoen, Eddy
;
Lee, Jae Woo
;
Claeys, Cor
Journal
IEEE Transactions on Electron Devices
Abstract
Description
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1937
since deposited on 2021-10-22
Acq. date: 2025-10-24
Citations
Metrics
Views
1937
since deposited on 2021-10-22
Acq. date: 2025-10-24
Citations