Assessment of the impact of inelastic tunneling on the frequency-depth conversion from low-frequency noise spectra

dc.contributor.author	Simoen, Eddy
dc.contributor.author	Lee, Jae Woo
dc.contributor.author	Claeys, Cor
dc.contributor.imecauthor	Simoen, Eddy
dc.contributor.orcidimec	Simoen, Eddy::0000-0002-5218-4046
dc.date.accessioned	2021-10-22T05:52:19Z
dc.date.available	2021-10-22T05:52:19Z
dc.date.embargo	9999-12-31
dc.date.issued	2014
dc.identifier.issn	0018-9383
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/24530
dc.identifier.url	http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=6702481&queryText%3DAssessment+of+the+impact+of+inelastic+tunneli
dc.source.beginpage	634
dc.source.endpage	637
dc.source.issue	2
dc.source.journal	IEEE Transactions on Electron Devices
dc.source.volume	61
dc.title	Assessment of the impact of inelastic tunneling on the frequency-depth conversion from low-frequency noise spectra
dc.type	Journal article
dspace.entity.type	Publication
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