Publication:

Harnessing charge injection in Kelvin probe force microscopy for the evaluation of oxides

Date

2021
Journal article
https://doi.org/10.1016/j.sse.2021.108136
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Harnessing_charge_injection_in_Kelvin_probe_force_microscopy_for_the_evaluation_of_oxides 3.45 MB

Author(s)

Celano, Umberto  
;
Lee, Y.
;
Serron, Jill  
;
Smith, Cole  
;
Franco, Jacopo  
;
Ryu, K.
;
Kim, M.
;
Park, S.
;
Lee, J.
;
Kim, J.
;
van der Heide, Paul  

Journal

SOLID-STATE ELECTRONICS

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172 since deposited on 2021-11-02
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