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Harnessing charge injection in Kelvin probe force microscopy for the evaluation of oxides
Publication:
Harnessing charge injection in Kelvin probe force microscopy for the evaluation of oxides
Date
2021
Journal article
https://doi.org/10.1016/j.sse.2021.108136
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Harnessing_charge_injection_in_Kelvin_probe_force_microscopy_for_the_evaluation_of_oxides
3.45 MB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Celano, Umberto
;
Lee, Y.
;
Serron, Jill
;
Smith, Cole
;
Franco, Jacopo
;
Ryu, K.
;
Kim, M.
;
Park, S.
;
Lee, J.
;
Kim, J.
;
van der Heide, Paul
Journal
SOLID-STATE ELECTRONICS
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137
since deposited on 2021-11-02
38
item.page.metrics.field.last-week
Acq. date: 2025-10-25
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1855
since deposited on 2021-11-02
403
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations