Publication:

Harnessing charge injection in Kelvin probe force microscopy for the evaluation of oxides

Date

2021
Journal article
https://doi.org/10.1016/j.sse.2021.108136
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dc.contributor.authorCelano, Umberto
dc.contributor.authorLee, Y.
dc.contributor.authorSerron, Jill
dc.contributor.authorSmith, Cole
dc.contributor.authorFranco, Jacopo
dc.contributor.authorRyu, K.
dc.contributor.authorKim, M.
dc.contributor.authorPark, S.
dc.contributor.authorLee, J.
dc.contributor.authorKim, J.
dc.contributor.authorvan der Heide, Paul
dc.contributor.imecauthorCelano, Umberto
dc.contributor.imecauthorSerron, Jill
dc.contributor.imecauthorSmith, Cole
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorvan der Heide, Paul
dc.contributor.orcidimecCelano, Umberto::0000-0002-2856-3847
dc.contributor.orcidimecSerron, Jill::0000-0002-9101-8139
dc.contributor.orcidimecSmith, Cole::0000-0002-6778-3391
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecvan der Heide, Paul::0000-0001-6292-0329
dc.date.accessioned2021-12-09T15:16:26Z
dc.date.available2021-11-02T15:54:52Z
dc.date.available2021-12-09T15:16:26Z
dc.date.embargo2023-07-18
dc.date.issued2021
dc.identifier.doi10.1016/j.sse.2021.108136
dc.identifier.issn0038-1101
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/37420
dc.publisherPERGAMON-ELSEVIER SCIENCE LTD
dc.source.issuena
dc.source.journalSOLID-STATE ELECTRONICS
dc.source.numberofpages4
dc.source.volume185
dc.title

Harnessing charge injection in Kelvin probe force microscopy for the evaluation of oxides

dc.typeJournal article
dspace.entity.typePublication
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