Publication:
Investigation of defect states in AlGaN/GaN high electron mobility transistors by small-signal admittance analysis
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185 since deposited on 2024-11-02
33last month
10last week
Acq. date: 2026-04-06
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103 since deposited on 2024-11-02
1last month
Acq. date: 2026-04-06
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