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Investigation of defect states in AlGaN/GaN high electron mobility transistors by small-signal admittance analysis
Publication:
Investigation of defect states in AlGaN/GaN high electron mobility transistors by small-signal admittance analysis
Date
2024
Journal article
https://doi.org/10.1063/5.0228156
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Rai, Narendra
;
Sarkar, Ritam
;
Mahajan, Ashutosh
;
Laha, Apurba
;
Saha, Dipankar
;
Ganguly, Swaroop
Journal
JOURNAL OF APPLIED PHYSICS
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since deposited on 2024-11-02
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item.page.metrics.field.last-week
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102
since deposited on 2024-11-02
Acq. date: 2025-10-27
Citations