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Investigation of defect states in AlGaN/GaN high electron mobility transistors by small-signal admittance analysis

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Acq. date: 2026-08-05

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253 since deposited on 2024-11-02
17last month
2last week
Acq. date: 2026-08-05

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106 since deposited on 2024-11-02
2last month
2last week
Acq. date: 2026-08-05

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