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In depth analysis of post-program VT instability after electrical stress in 3D SONOS memories
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In depth analysis of post-program VT instability after electrical stress in 3D SONOS memories
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Date
2016
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Subirats, Alexandre
;
Arreghini, Antonio
;
Van den Bosch, Geert
;
Degraeve, Robin
;
Linten, Dimitri
;
Furnemont, Arnaud
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1860
since deposited on 2021-10-23
Acq. date: 2026-07-18
Citations
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Views
1860
since deposited on 2021-10-23
Acq. date: 2026-07-18
Citations