Publication:
In depth analysis of post-program VT instability after electrical stress in 3D SONOS memories
Date
| dc.contributor.author | Subirats, Alexandre | |
| dc.contributor.author | Arreghini, Antonio | |
| dc.contributor.author | Van den Bosch, Geert | |
| dc.contributor.author | Degraeve, Robin | |
| dc.contributor.author | Linten, Dimitri | |
| dc.contributor.author | Furnemont, Arnaud | |
| dc.contributor.imecauthor | Arreghini, Antonio | |
| dc.contributor.imecauthor | Van den Bosch, Geert | |
| dc.contributor.imecauthor | Degraeve, Robin | |
| dc.contributor.imecauthor | Linten, Dimitri | |
| dc.contributor.imecauthor | Furnemont, Arnaud | |
| dc.contributor.orcidimec | Arreghini, Antonio::0000-0002-7493-9681 | |
| dc.contributor.orcidimec | Van den Bosch, Geert::0000-0001-9971-6954 | |
| dc.contributor.orcidimec | Linten, Dimitri::0000-0001-8434-1838 | |
| dc.contributor.orcidimec | Furnemont, Arnaud::0000-0002-6378-1030 | |
| dc.date.accessioned | 2021-10-23T15:18:11Z | |
| dc.date.available | 2021-10-23T15:18:11Z | |
| dc.date.issued | 2016-05 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/27360 | |
| dc.source.beginpage | 84 | |
| dc.source.conference | International Memory Workshop - IMW | |
| dc.source.conferencedate | 15/05/2016 | |
| dc.source.conferencelocation | Paris France | |
| dc.source.endpage | 87 | |
| dc.title | In depth analysis of post-program VT instability after electrical stress in 3D SONOS memories | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
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