Publication:

P+/N junction leakage in thin selectively grown Ge-in-STI substrates

Date

2010
Journal article
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dc.contributor.authorEneman, Geert
dc.contributor.authorYang, Rui
dc.contributor.authorWang, Gang
dc.contributor.authorDe Jaeger, Brice
dc.contributor.authorLoo, Roger
dc.contributor.authorClaeys, Cor
dc.contributor.authorCaymax, Matty
dc.contributor.authorMeuris, Marc
dc.contributor.authorHeyns, Marc
dc.contributor.authorSimoen, Eddy
dc.contributor.imecauthorEneman, Geert
dc.contributor.imecauthorDe Jaeger, Brice
dc.contributor.imecauthorLoo, Roger
dc.contributor.imecauthorCaymax, Matty
dc.contributor.imecauthorMeuris, Marc
dc.contributor.imecauthorHeyns, Marc
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecEneman, Geert::0000-0002-5849-3384
dc.contributor.orcidimecDe Jaeger, Brice::0000-0001-8804-7556
dc.contributor.orcidimecLoo, Roger::0000-0003-3513-6058
dc.contributor.orcidimecMeuris, Marc::0000-0002-9580-6810
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.accessioned2021-10-18T16:15:02Z
dc.date.available2021-10-18T16:15:02Z
dc.date.issued2010
dc.identifier.issn0040-6090
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/17077
dc.source.beginpage2489
dc.source.endpage2492
dc.source.issue9
dc.source.journalThin Solid Films
dc.source.volume518
dc.title

P+/N junction leakage in thin selectively grown Ge-in-STI substrates

dc.typeJournal article
dspace.entity.typePublication
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