Publication:
SPICE modelling of hot-carrier degradation in Si1–xGex S/D and HfSiON based pMOS transistors
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1878 since deposited on 2021-10-18
1last month
Acq. date: 2026-02-25
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Statistics
Views
1878 since deposited on 2021-10-18
1last month
Acq. date: 2026-02-25
Citations