SPICE modelling of hot-carrier degradation in Si1–xGex S/D and HfSiON based pMOS transistors

Publication:

2010

Journal article

Author(s)

;

;

;

;

;

;

;

Microelectronics Reliability

1878 since deposited on 2021-10-18

Acq. date: 2026-03-17