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SPICE modelling of hot-carrier degradation in Si1–xGex S/D and HfSiON based pMOS transistors

Date

2010
Journal article
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dc.contributor.authorMartin Martinez, Javier
dc.contributor.authorAmat, Esteve
dc.contributor.authorBargallo Gonzalez, Mireia
dc.contributor.authorVerheyen, Peter
dc.contributor.authorRodriguez, Rosana
dc.contributor.authorNafria, Montse
dc.contributor.authorAymerich, Xavier
dc.contributor.authorSimoen, Eddy
dc.contributor.imecauthorVerheyen, Peter
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecVerheyen, Peter::0000-0002-8245-9442
dc.date.accessioned2021-10-18T18:53:30Z
dc.date.available2021-10-18T18:53:30Z
dc.date.issued2010
dc.identifier.issn0026-2714
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/17592
dc.source.beginpage1263
dc.source.endpage1266
dc.source.issue9_11
dc.source.journalMicroelectronics Reliability
dc.source.volume50
dc.title

SPICE modelling of hot-carrier degradation in Si1–xGex S/D and HfSiON based pMOS transistors

dc.typeJournal article
dspace.entity.typePublication
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