Publication:
Characterization of the Total Charge and Time Duration for Single-Event Transient Voltage Pulses in a 65-nm CMOS Technology
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3 since deposited on 2022-07-31
Acq. date: 2025-10-23
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1630 since deposited on 2022-07-31
Acq. date: 2025-10-23
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3 since deposited on 2022-07-31
Acq. date: 2025-10-23
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1630 since deposited on 2022-07-31
Acq. date: 2025-10-23
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