Publication:
Analysis of the Gate Current's Influence on the RF Power Performance of InAlN/GaN HEMTs
| dc.contributor.author | Xiao, Dongping | |
| dc.contributor.author | Schreurs, Dominique M. M. -P. | |
| dc.contributor.author | ElKashlan, Rana | |
| dc.contributor.author | Zhang, Yang | |
| dc.contributor.author | Cooman, Adam | |
| dc.contributor.author | Khaled, Ahmad | |
| dc.contributor.author | Smellie, Daanish | |
| dc.contributor.author | Alian, AliReza | |
| dc.contributor.author | Asad, Muhammad | |
| dc.contributor.author | Parvais, Bertrand | |
| dc.contributor.author | Wambacq, Piet | |
| dc.contributor.author | Peralagu, Uthayasankaran | |
| dc.contributor.author | Collaert, Nadine | |
| dc.contributor.imecauthor | Xiao, Dongping | |
| dc.contributor.imecauthor | ElKashlan, Rana | |
| dc.contributor.imecauthor | Zhang, Yang | |
| dc.contributor.imecauthor | Cooman, Adam | |
| dc.contributor.imecauthor | Khaled, Ahmad | |
| dc.contributor.imecauthor | Smellie, Daanish | |
| dc.contributor.imecauthor | Alian, AliReza | |
| dc.contributor.imecauthor | Asad, Muhammad | |
| dc.contributor.imecauthor | Parvais, Bertrand | |
| dc.contributor.imecauthor | Wambacq, Piet | |
| dc.contributor.imecauthor | Peralagu, Uthayasankaran | |
| dc.contributor.imecauthor | Collaert, Nadine | |
| dc.contributor.orcidimec | Xiao, Dongping::0000-0002-7581-870X | |
| dc.contributor.orcidimec | ElKashlan, Rana::0000-0003-0576-4344 | |
| dc.contributor.orcidimec | Zhang, Yang::0000-0002-1540-2462 | |
| dc.contributor.orcidimec | Cooman, Adam::0000-0002-5206-1062 | |
| dc.contributor.orcidimec | Khaled, Ahmad::0000-0003-2892-3176 | |
| dc.contributor.orcidimec | Smellie, Daanish::0000-0002-8490-2436 | |
| dc.contributor.orcidimec | Alian, AliReza::0000-0003-3463-416X | |
| dc.contributor.orcidimec | Asad, Muhammad::0000-0002-5204-932X | |
| dc.contributor.orcidimec | Parvais, Bertrand::0000-0003-0769-7069 | |
| dc.contributor.orcidimec | Wambacq, Piet::0000-0003-4388-7257 | |
| dc.contributor.orcidimec | Peralagu, Uthayasankaran::0000-0001-9166-4408 | |
| dc.contributor.orcidimec | Collaert, Nadine::0000-0002-8062-3165 | |
| dc.date.accessioned | 2025-05-05T11:47:37Z | |
| dc.date.available | 2024-08-15T18:46:44Z | |
| dc.date.available | 2025-05-05T11:47:37Z | |
| dc.date.issued | 2025 | |
| dc.description.wosFundingText | This work was supported by imec Advanced RF imec Industrial Affiliation Program (IIAP). | |
| dc.identifier.doi | 10.1109/TMTT.2024.3431196 | |
| dc.identifier.issn | 0018-9480 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/44305 | |
| dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | |
| dc.source.beginpage | 779 | |
| dc.source.endpage | 788 | |
| dc.source.issue | 2 | |
| dc.source.journal | IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | |
| dc.source.numberofpages | 10 | |
| dc.source.volume | 73 | |
| dc.subject.keywords | ALGAN/GAN | |
| dc.subject.keywords | RELIABILITY | |
| dc.title | Analysis of the Gate Current's Influence on the RF Power Performance of InAlN/GaN HEMTs | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
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