Publication:
Channel hot-carrier degradation in pMOS and nMOS short channel transistors with high-k dielectric stack
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1974 since deposited on 2021-10-18
3last month
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Acq. date: 2026-05-18
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Statistics
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1974 since deposited on 2021-10-18
3last month
1last week
Acq. date: 2026-05-18
Citations