Publication:
A comparative study of gate direct tunneling and drain leakage currents in N-MOSFET's with sub-2-nm gate oxides
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1902 since deposited on 2021-10-14
4last month
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Acq. date: 2026-01-08
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1902 since deposited on 2021-10-14
4last month
1last week
Acq. date: 2026-01-08
Citations