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Impacts of Pulsing Schemes on the Endurance of Ferroelectric Metal-Ferroelectric-Insulator-Semiconductor Capacitors
Publication:
Impacts of Pulsing Schemes on the Endurance of Ferroelectric Metal-Ferroelectric-Insulator-Semiconductor Capacitors
Date
2022
Journal article
https://doi.org/10.1109/JEDS.2022.3141756
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3.66 MB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Wu, Cheng-Hung
;
Ronchi, Nicolo
;
Wang, Kuan-Chi
;
Wang, Yu-Yun
;
Mcmitchell, Sean
;
Banerjee, Kaustuv
;
van den Bosch, Geert
;
van Houdt, Jan
;
Wu, Tian-Li
Journal
IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY
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since deposited on 2023-06-20
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Downloads
120
since deposited on 2023-06-20
44
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Views
1183
since deposited on 2023-06-20
397
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations