Publication:

Impacts of Pulsing Schemes on the Endurance of Ferroelectric Metal-Ferroelectric-Insulator-Semiconductor Capacitors

Date

2022
Journal article
https://doi.org/10.1109/JEDS.2022.3141756
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dc.contributor.authorWu, Cheng-Hung
dc.contributor.authorRonchi, Nicolo
dc.contributor.authorWang, Kuan-Chi
dc.contributor.authorWang, Yu-Yun
dc.contributor.authorMcmitchell, Sean
dc.contributor.authorBanerjee, Kaustuv
dc.contributor.authorvan den Bosch, Geert
dc.contributor.authorvan Houdt, Jan
dc.contributor.authorWu, Tian-Li
dc.contributor.imecauthorRonchi, Nicolo
dc.contributor.imecauthorMcmitchell, Sean
dc.contributor.imecauthorBanerjee, Kaustuv
dc.contributor.imecauthorvan den Bosch, Geert
dc.contributor.imecauthorvan Houdt, Jan
dc.contributor.orcidextWu, Cheng-Hung::0000-0002-7312-2370
dc.contributor.orcidextWang, Kuan-Chi::0000-0001-8688-0990
dc.contributor.orcidextWu, Tian-Li::0000-0001-6788-5470
dc.contributor.orcidimecMcmitchell, Sean::0000-0002-9916-0973
dc.contributor.orcidimecvan den Bosch, Geert::0000-0001-9971-6954
dc.contributor.orcidimecRonchi, Nicolo::0000-0002-7961-4077
dc.contributor.orcidimecBanerjee, Kaustuv::0000-0001-8003-6211
dc.contributor.orcidimecVan den Bosch, Geert::0000-0001-9971-6954
dc.contributor.orcidimecVan Houdt, Jan::0000-0003-1381-6925
dc.contributor.orcidimecMcMitchell, Sean::0000-0002-9916-0973
dc.date.accessioned2023-06-29T14:47:15Z
dc.date.available2023-06-20T10:35:23Z
dc.date.available2023-06-29T14:47:15Z
dc.date.embargo2022-02-16
dc.date.issued2022
dc.description.wosFundingTextThis work was supported in part by the "Center for the Semiconductor Technology Research" from The Featured Areas Research Center Program within the framework of the Higher Education Sprout Project by the Ministry of Education (MOE) in Taiwan; in part by the Ministry of Science and Technology, Taiwan, under Grant MOST 110-2634-F-009-027 and Grant MOST 110-2622-8-009-018-SB; and in part by the Young Scholar Fellowship Program under Grant MOST 110-2636-E-009-023.
dc.identifier.doi10.1109/JEDS.2022.3141756
dc.identifier.issn2168-6734
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/41885
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
dc.source.beginpage109
dc.source.endpage114
dc.source.issuena
dc.source.journalIEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY
dc.source.numberofpages6
dc.source.volume10
dc.subject.keywordsFIELD
dc.subject.keywordsPOLARIZATION
dc.subject.keywordsMEMORY
dc.title

Impacts of Pulsing Schemes on the Endurance of Ferroelectric Metal-Ferroelectric-Insulator-Semiconductor Capacitors

dc.typeJournal article
dspace.entity.typePublication
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