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Analytical model for failure rate prediction due to anomalous charge loss of Flash memories
Publication:
Analytical model for failure rate prediction due to anomalous charge loss of Flash memories
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Date
2001
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Degraeve, Robin
;
Schuler, Franz
;
Lorenzini, Martino
;
Wellekens, Dirk
;
Hendrickx, Paul
;
Van Houdt, Jan
;
Haspeslagh, Luc
;
Groeseneken, Guido
;
Tempel, Georg
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1969
since deposited on 2021-10-14
4
last month
3
last week
Acq. date: 2026-10-04
Citations
Statistics
Views
1969
since deposited on 2021-10-14
4
last month
3
last week
Acq. date: 2026-10-04
Citations