Publication:

Endurance/retention trade-off on HfO2 / metal cap 1T1R bipolar RRAM

Date

2013

Journal article

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Files

25703.pdf 1.12 MB

Author(s)

;

;

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Govoreanu, Bogdan

;

Degraeve, Robin

;

Kar, Gouri Sankar

;

Fantini, Andrea

;

Groeseneken, Guido

;

;

Journal

IEEE Transactions on Electron Devices

Statistics

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Acq. date: 2026-01-27