Publication:
Positive and negative bias temperature instability in La2O3 and Al2O3 capped high-k MOSFETs
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1805 since deposited on 2021-10-17
1last month
Acq. date: 2025-12-15
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Views
1805 since deposited on 2021-10-17
1last month
Acq. date: 2025-12-15
Citations