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Ion Beam Induced Modification of Si-Based Material during Sputter Profiling

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dc.contributor.authorDe Coster, Walter
dc.date.accessioned2021-09-29T13:04:56Z
dc.date.available2021-09-29T13:04:56Z
dc.date.issued1995-01
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/584
dc.title

Ion Beam Induced Modification of Si-Based Material during Sputter Profiling

dc.typePHD thesis
dspace.entity.typePublication
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