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Low-frequency noise behavior in p-channel SOI FinFETs processed with different strain techniques
Publication:
Low-frequency noise behavior in p-channel SOI FinFETs processed with different strain techniques
Date
2009
Proceedings Paper
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18608.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Guo, W.
;
Talmat, R.
;
Cretu, B.
;
Routoure, J.M.
;
Carin, R.
;
Mercha, Abdelkarim
;
Simoen, Eddy
;
Claeys, Cor
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Abstract
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1914
since deposited on 2021-10-17
Acq. date: 2025-12-09
Citations
Metrics
Views
1914
since deposited on 2021-10-17
Acq. date: 2025-12-09
Citations