Publication:

Low-frequency noise behavior in p-channel SOI FinFETs processed with different strain techniques

Date

2009
Proceedings Paper
Simple item page Full metadata Statistics
 
dc.contributor.authorGuo, W.
dc.contributor.authorTalmat, R.
dc.contributor.authorCretu, B.
dc.contributor.authorRoutoure, J.M.
dc.contributor.authorCarin, R.
dc.contributor.authorMercha, Abdelkarim
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.imecauthorMercha, Abdelkarim
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecMercha, Abdelkarim::0000-0002-2174-6958
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.accessioned2021-10-17T22:35:35Z
dc.date.available2021-10-17T22:35:35Z
dc.date.embargo9999-12-31
dc.date.issued2009
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/15404
dc.source.beginpage298
dc.source.conference20th International Conference on Noise and Fluctuations - ICNF
dc.source.conferencedate14/06/2009
dc.source.conferencelocationPisa Italy
dc.source.endpage298
dc.title

Low-frequency noise behavior in p-channel SOI FinFETs processed with different strain techniques

dc.typeProceedings paper
dspace.entity.typePublication
Files

Original bundle

Name:
18608.pdf
Size:
388.61 KB
Format:
Adobe Portable Document Format
Download
Publication available in collections:
Conference contributions