Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Articles
Introduction to the special issue on 'Measuring Quality of Experience for Advanced Media Technologies and Services'
Publication:
Introduction to the special issue on 'Measuring Quality of Experience for Advanced Media Technologies and Services'
Date
2017-02
Journal article
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Winkler, Stefan
;
Wen Chen, Chang
;
Raake, Alexander
;
Schelkens, Peter
;
Skorin-Kapov, Lea
Journal
IEEE Journal of Selected Topics in Signal Processing
Abstract
Description
Metrics
Views
1922
since deposited on 2021-10-24
Acq. date: 2025-10-25
Citations
Metrics
Views
1922
since deposited on 2021-10-24
Acq. date: 2025-10-25
Citations