Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Articles
Introduction to the special issue on 'Measuring Quality of Experience for Advanced Media Technologies and Services'
Publication:
Introduction to the special issue on 'Measuring Quality of Experience for Advanced Media Technologies and Services'
Copy permalink
Date
2017
Journal article
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Winkler, Stefan
;
Wen Chen, Chang
;
Raake, Alexander
;
Schelkens, Peter
;
Skorin-Kapov, Lea
Journal
IEEE Journal of Selected Topics in Signal Processing
Abstract
Description
Statistics
Views
1926
since deposited on 2021-10-24
Acq. date: 2026-08-06
Citations
Statistics
Views
1926
since deposited on 2021-10-24
Acq. date: 2026-08-06
Citations