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Introduction to the special issue on 'Measuring Quality of Experience for Advanced Media Technologies and Services'

Date

2017-02
Journal article
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dc.contributor.authorWinkler, Stefan
dc.contributor.authorWen Chen, Chang
dc.contributor.authorRaake, Alexander
dc.contributor.authorSchelkens, Peter
dc.contributor.authorSkorin-Kapov, Lea
dc.contributor.imecauthorSchelkens, Peter
dc.contributor.orcidimecSchelkens, Peter::0000-0003-0908-1655
dc.date.accessioned2021-10-24T19:02:41Z
dc.date.available2021-10-24T19:02:41Z
dc.date.issued2017-02
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/29943
dc.identifier.urlhttps://ieeexplore.ieee.org/document/7852547/
dc.source.beginpage335
dc.source.endpage340
dc.source.issue1
dc.source.journalIEEE Journal of Selected Topics in Signal Processing
dc.source.volume11
dc.title

Introduction to the special issue on 'Measuring Quality of Experience for Advanced Media Technologies and Services'

dc.typeJournal article
dspace.entity.typePublication
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