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Direct evidence of linewidth effect: Ni31Si12 and Ni3Si formation on 25 nm Ni fully silicided gates
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Direct evidence of linewidth effect: Ni31Si12 and Ni3Si formation on 25 nm Ni fully silicided gates
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Date
2007
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Kittl, Jorge
;
Lauwers, Anne
;
Demeurisse, Caroline
;
Vrancken, Christa
;
Kubicek, Stefan
;
Absil, Philippe
;
Biesemans, Serge
Journal
Applied Physics Letters
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1899
since deposited on 2021-10-16
1
last month
Acq. date: 2025-12-15
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Metrics
Views
1899
since deposited on 2021-10-16
1
last month
Acq. date: 2025-12-15
Citations