Publication:

Contribution of mask roughness in stochasticity of high-NA EUV imaging

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Acq. date: 2026-01-08

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Downloads

665 since deposited on 2022-05-22
44last month
10last week
Acq. date: 2026-01-08

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1673 since deposited on 2022-05-22
1last month
Acq. date: 2026-01-08

Citations