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The impact of the gate oxide thickness reduction on the gate induced floating body effect in SOI nMOSFETs
Publication:
The impact of the gate oxide thickness reduction on the gate induced floating body effect in SOI nMOSFETs
Date
2007
Proceedings Paper
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14906.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Ghedini der Agopian, Paula
;
Martino, J.A.
;
Simoen, Eddy
;
Claeys, Cor
Journal
Abstract
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1830
since deposited on 2021-10-16
Acq. date: 2025-10-27
Citations
Metrics
Views
1830
since deposited on 2021-10-16
Acq. date: 2025-10-27
Citations