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The effect of composition on the bond structure and refractive index of silicon nitride

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dc.contributor.authorVerlaan, Vasco
dc.contributor.authorVerkerk, A.D.
dc.contributor.authorArnoldbik, W.M.
dc.contributor.authorVan der Werf, C.H.M.
dc.contributor.authorBakker, R.
dc.contributor.authorHouweling, Z.S.
dc.contributor.authorRomijn, I.G.
dc.contributor.authorBorsa, D.M.
dc.contributor.authorWeeber, A.W.
dc.contributor.authorLuxembourg, S.L.
dc.contributor.authorZeman, M.
dc.contributor.authorDekkers, Harold
dc.contributor.authorSchropp, R.E.I.
dc.contributor.imecauthorDekkers, Harold
dc.contributor.orcidimecDekkers, Harold::0000-0003-4778-5709
dc.date.accessioned2021-10-18T04:50:36Z
dc.date.available2021-10-18T04:50:36Z
dc.date.issued2009
dc.identifier.issn0040-6090
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/16482
dc.source.beginpage3499
dc.source.endpage3502
dc.source.journalThin Solid Films
dc.source.volume517
dc.title

The effect of composition on the bond structure and refractive index of silicon nitride

dc.typeJournal article
dspace.entity.typePublication
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