Publication:
Direct measurement of semiconductors surface states parameters using Kelvin probe force microscopy
Date
Loading...
Journal
Abstract
Description
Metrics
Views
1901 since deposited on 2021-10-15
1last month
Acq. date: 2025-12-09
Citations
Metrics
Views
1901 since deposited on 2021-10-15
1last month
Acq. date: 2025-12-09
Citations