Publication:
Direct measurement of semiconductors surface states parameters using Kelvin probe force microscopy
Date
| dc.contributor.author | Rosenwaks, Y. | |
| dc.contributor.author | Saraf, S. | |
| dc.contributor.author | Eyben, Pierre | |
| dc.contributor.author | Vandervorst, Wilfried | |
| dc.contributor.imecauthor | Eyben, Pierre | |
| dc.contributor.imecauthor | Vandervorst, Wilfried | |
| dc.date.accessioned | 2021-10-15T06:26:17Z | |
| dc.date.available | 2021-10-15T06:26:17Z | |
| dc.date.issued | 2003 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/8086 | |
| dc.source.conference | 12th International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques - STM | |
| dc.source.conferencedate | 21/07/2003 | |
| dc.source.conferencelocation | Eindhoven The Netherlands | |
| dc.title | Direct measurement of semiconductors surface states parameters using Kelvin probe force microscopy | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | ||
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