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DSA patterning scaling through lithography and etch process integration
Publication:
DSA patterning scaling through lithography and etch process integration
Date
2012
Presentation
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25216.pdf
2.41 MB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Rathsack, Ben
;
Gronheid, Roel
Journal
Abstract
Description
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1913
since deposited on 2021-10-20
418
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Acq. date: 2025-10-24
Citations
Metrics
Views
1913
since deposited on 2021-10-20
418
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations