Publication:

Improvement of the CMOS characteristics of bulk Si FinFETs by high temperature ion implantation

Date

Loading...
Thumbnail Image

Abstract

Description

Metrics

Views

1907 since deposited on 2021-10-23
Acq. date: 2025-10-23

Citations

Metrics

Views

1907 since deposited on 2021-10-23
Acq. date: 2025-10-23

Citations