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Modelling and experimental investigation of silicide-induced mechanical stress and strain in transistors technology
Publication:
Modelling and experimental investigation of silicide-induced mechanical stress and strain in transistors technology
Date
2008-03
Dissertation
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17816.pdf
18.97 MB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Torregiani, Cristina
Journal
Abstract
Description
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1944
since deposited on 2021-10-17
Acq. date: 2025-10-23
Citations
Metrics
Views
1944
since deposited on 2021-10-17
Acq. date: 2025-10-23
Citations