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HF based solutions for HfO2 removal. Effect of pH and temperature on HfO2:SiO2 etch selectivity
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HF based solutions for HfO2 removal. Effect of pH and temperature on HfO2:SiO2 etch selectivity
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Date
2005
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Paraschiv, Vasile
;
Claes, Martine
;
Baklanov, Mikhaïl
;
Boullart, Werner
;
De Gendt, Stefan
;
Vanhaelemeersch, Serge
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Acq. date: 2025-12-16
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since deposited on 2021-10-16
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Acq. date: 2025-12-15
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Downloads
2
since deposited on 2021-10-16
Acq. date: 2025-12-16
Views
1993
since deposited on 2021-10-16
5
last month
Acq. date: 2025-12-15
Citations