Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Articles
Analysis of the temperature dependence of trap-assisted tunneling in Ge pFET junctions
Publication:
Analysis of the temperature dependence of trap-assisted tunneling in Ge pFET junctions
Copy permalink
Date
2011
Journal article
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
23038.pdf
2.65 MB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Bargallo Gonzalez, Mireia
;
Eneman, Geert
;
Wang, Gang
;
De Jaeger, Brice
;
Simoen, Eddy
;
Claeys, Cor
Journal
Journal of the Electrochemical Society
Abstract
Description
Metrics
Views
1951
since deposited on 2021-10-19
2
last month
Acq. date: 2025-12-13
Citations
Metrics
Views
1951
since deposited on 2021-10-19
2
last month
Acq. date: 2025-12-13
Citations