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Analysis of the temperature dependence of trap-assisted tunneling in Ge pFET junctions
Publication:
Analysis of the temperature dependence of trap-assisted tunneling in Ge pFET junctions
Date
2011
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Bargallo Gonzalez, Mireia
;
Eneman, Geert
;
Wang, Gang
;
De Jaeger, Brice
;
Simoen, Eddy
;
Claeys, Cor
Journal
Journal of the Electrochemical Society
Abstract
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1949
since deposited on 2021-10-19
455
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations
Metrics
Views
1949
since deposited on 2021-10-19
455
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations