Publication:

Analysis of the temperature dependence of trap-assisted tunneling in Ge pFET junctions

Date

2011
Journal article
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dc.contributor.authorBargallo Gonzalez, Mireia
dc.contributor.authorEneman, Geert
dc.contributor.authorWang, Gang
dc.contributor.authorDe Jaeger, Brice
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.imecauthorEneman, Geert
dc.contributor.imecauthorDe Jaeger, Brice
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecEneman, Geert::0000-0002-5849-3384
dc.contributor.orcidimecDe Jaeger, Brice::0000-0001-8804-7556
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.accessioned2021-10-19T12:31:46Z
dc.date.available2021-10-19T12:31:46Z
dc.date.embargo9999-12-31
dc.date.issued2011
dc.identifier.issn0013-4651
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/18529
dc.source.beginpageH955
dc.source.endpageH960
dc.source.issue10
dc.source.journalJournal of the Electrochemical Society
dc.source.volume158
dc.title

Analysis of the temperature dependence of trap-assisted tunneling in Ge pFET junctions

dc.typeJournal article
dspace.entity.typePublication
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