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Study of origin, impact and solutions of processing damage in low dielectric constant materials for advanced interconnect applications
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Study of origin, impact and solutions of processing damage in low dielectric constant materials for advanced interconnect applications
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2010-09
Dissertation
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21280.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Urbanowicz, Adam
Journal
Abstract
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1853
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Acq. date: 2025-12-16
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Metrics
Views
1853
since deposited on 2021-10-18
2
last month
Acq. date: 2025-12-16
Citations