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Impact of cobalt silicidation on the low-frequency noise behavior of shallow P-N junctions
Publication:
Impact of cobalt silicidation on the low-frequency noise behavior of shallow P-N junctions
Date
2000
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Lukyanchikova, N. B.
;
Petrichuk, M. V.
;
Garbar, N.
;
Simoen, Eddy
;
Poyai, Amporn
;
Claeys, Cor
Journal
IEEE Electron Device Letters
Abstract
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1975
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations
Metrics
Views
1975
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations