Publication:
Physical model of GR noise observed under inversion conditions near the pSi/SiO2 interfaces in SIMOX submicron MOSFETs and its application for defect characterization
Date
Loading...
Files
Journal
Abstract
Description
Statistics
Views
1850 since deposited on 2021-09-30
1last month
1last week
Acq. date: 2026-08-07
Citations
Statistics
Views
1850 since deposited on 2021-09-30
1last month
1last week
Acq. date: 2026-08-07
Citations