Publication:
Physical model of GR noise observed under inversion conditions near the pSi/SiO2 interfaces in SIMOX submicron MOSFETs and its application for defect characterization
Date
Loading...
Files
Journal
Abstract
Description
Metrics
Views
1849 since deposited on 2021-09-30
Acq. date: 2025-12-11
Citations
Metrics
Views
1849 since deposited on 2021-09-30
Acq. date: 2025-12-11
Citations