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Physical model of GR noise observed under inversion conditions near the pSi/SiO2 interfaces in SIMOX submicron MOSFETs and its application for defect characterization
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1847 since deposited on 2021-09-30
Acq. date: 2025-10-23
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1847 since deposited on 2021-09-30
Acq. date: 2025-10-23
Citations