Publication:

Study of novel EUVL mask absorber candidates

Date

2021
Journal article
https://doi.org/10.1117/1.JMM.20.2.021002
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dc.contributor.authorWu, Meiyi
dc.contributor.authorThakare, Devesh
dc.contributor.authorDe Marneffe, Jean-Francois
dc.contributor.authorJaenen, Patrick
dc.contributor.authorSouriau, Laurent
dc.contributor.authorOpsomer, Karl
dc.contributor.authorSoulie, Jean-Philippe
dc.contributor.authorErdmann, Andreas
dc.contributor.authorMesilhy, Hazem
dc.contributor.authorNaujok, Philipp
dc.contributor.authorFoltin, Markus
dc.contributor.authorSoltwisch, Victor
dc.contributor.authorSaadeh, Qais
dc.contributor.authorPhilipsen, Vicky
dc.contributor.imecauthorWu, Meiyi
dc.contributor.imecauthorThakare, Devesh
dc.contributor.imecauthorDe Marneffe, Jean-Francois
dc.contributor.imecauthorJaenen, Patrick
dc.contributor.imecauthorSouriau, Laurent
dc.contributor.imecauthorOpsomer, Karl
dc.contributor.imecauthorSoulie, Jean-Philippe
dc.contributor.imecauthorPhilipsen, Vicky
dc.contributor.orcidimecSouriau, Laurent::0000-0002-5138-5938
dc.contributor.orcidimecPhilipsen, Vicky::0000-0002-2959-432X
dc.contributor.orcidimecThakare, Devesh::0000-0003-3265-7042
dc.contributor.orcidimecSoulie, Jean-Philippe::0000-0002-5956-6485
dc.date.accessioned2022-02-21T14:15:33Z
dc.date.available2022-02-21T14:15:33Z
dc.date.issued2021
dc.identifier.doi10.1117/1.JMM.20.2.021002
dc.identifier.issn1932-5150
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/38955
dc.publisherSPIE-SOC PHOTO-OPTICAL INSTRUMENTATION ENGINEERS
dc.source.issue2
dc.source.journalJOURNAL OF MICRO-NANOPATTERNING MATERIALS AND METROLOGY-JM3
dc.source.numberofpages13
dc.source.volume20
dc.title

Study of novel EUVL mask absorber candidates

dc.typeJournal article
dspace.entity.typePublication
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