Publication:

Demonstration of Bilayer Gate Insulator for Improved Reliability in GaN-on-Si Vertical Transistors

Date

2020
Proceedings Paper
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Author(s)

Mukherjee, Kalparupa
;
De Santi, Carlo
;
Meneghesso, Gaudenzio
;
Zanoni, Enrico
;
Meneghini, Matteo
;
You, Shuzhen  
;
Geens, Karen  
;
Borga, Matteo  
;
Bakeroot, Benoit  
;
Decoutere, Stefaan  

Journal

na

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1809 since deposited on 2021-11-02
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Acq. date: 2026-03-17

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