Demonstration of Bilayer Gate Insulator for Improved Reliability in GaN-on-Si Vertical Transistors

Publication:

2020

Proceedings Paper

Author(s)

Mukherjee, Kalparupa

;

De Santi, Carlo

;

Meneghesso, Gaudenzio

;

Zanoni, Enrico

;

Meneghini, Matteo

;

;

;

;

;

na

1811 since deposited on 2021-11-02

Acq. date: 2026-06-26