Publication:
Demonstration of Bilayer Gate Insulator for Improved Reliability in GaN-on-Si Vertical Transistors
Date
Loading...
Journal
Abstract
Description
Metrics
Views
1807 since deposited on 2021-11-02
Acq. date: 2025-10-23
Citations
Metrics
Views
1807 since deposited on 2021-11-02
Acq. date: 2025-10-23
Citations