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Experimental study of time-dependent dielectric degradation by means of random telegraph noise spectroscopy
Publication:
Experimental study of time-dependent dielectric degradation by means of random telegraph noise spectroscopy
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Date
2024
Journal article
https://doi.org/10.1016/j.sse.2024.108877
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Saini, Nishant
;
Tierno, Davide
;
Croes, Kristof
;
Afanasiev, Valeri
;
Van Houdt, Jan
Journal
SOLID-STATE ELECTRONICS
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600
since deposited on 2024-04-01
1
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Acq. date: 2025-12-15
Citations
Metrics
Views
600
since deposited on 2024-04-01
1
last month
Acq. date: 2025-12-15
Citations