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Experimental study of time-dependent dielectric degradation by means of random telegraph noise spectroscopy

 
dc.contributor.authorSaini, Nishant
dc.contributor.authorTierno, Davide
dc.contributor.authorCroes, Kristof
dc.contributor.authorAfanasiev, Valeri
dc.contributor.authorVan Houdt, Jan
dc.contributor.imecauthorSaini, Nishant
dc.contributor.imecauthorTierno, Davide
dc.contributor.imecauthorCroes, Kristof
dc.contributor.imecauthorAfanasiev, Valeri
dc.contributor.imecauthorVan Houdt, Jan
dc.contributor.orcidimecTierno, Davide::0000-0003-4915-904X
dc.contributor.orcidimecCroes, Kristof::0000-0002-3955-0638
dc.contributor.orcidimecAfanasiev, Valeri::0000-0001-5018-4539
dc.contributor.orcidimecVan Houdt, Jan::0000-0003-1381-6925
dc.date.accessioned2024-11-21T14:47:30Z
dc.date.available2024-04-01T18:09:21Z
dc.date.available2024-11-21T14:47:30Z
dc.date.issued2024
dc.description.wosFundingTextN. S. acknowledges financial support from the Research Foundation Flanders (FWO) , Belgium through a PhD Fellowship - Strategic Basic Research (Grant No. 1SH0P24N) .
dc.identifier.doi10.1016/j.sse.2024.108877
dc.identifier.issn0038-1101
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/43761
dc.publisherPERGAMON-ELSEVIER SCIENCE LTD
dc.source.beginpageArt. 108877
dc.source.endpageN/A
dc.source.issueApril 2024
dc.source.journalSOLID-STATE ELECTRONICS
dc.source.numberofpages5
dc.source.volume214
dc.subject.keywordsTRAP GENERATION
dc.title

Experimental study of time-dependent dielectric degradation by means of random telegraph noise spectroscopy

dc.typeJournal article
dspace.entity.typePublication
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